Improving dimensional measurement from noisy atomic force microscopy images by non-local means filtering.
Author: Chen Y.
Correlation modeling between process condition of sandblasting and surface texture: A multi-scale approach.
Author: Ho HS, Bigerelle M, Vincent R, Deltomb R.
Scanning electron microscopy of the nail plate in onychomycosis patients with negative fungal culture.
Author: Yue X, Li Q, Wang H, Sun Y, Wang A, Zhang Q, Zhang C.
An ultrastructural study on corkscrew hairs and cigarette-ash-shaped hairs observed by dermoscopy of tinea capitis.
Author: Lu M, Ran Y, Dai Y, Lei S, Zhang C, Zhuang K, Hu W.
英文介紹
Scanning雜志英文介紹
Scanning provides an international and interdisciplinary medium for the rapid exchange of information among all scientists interested in scanning electron, scanning probe, and scanning optical microscopies. Areas of specific interest include all aspects of the instrumentation associated with scanning microscopies, correlative microscopy techniques, stereometry, stereology, analytic techniques, and novel applications of the microscopies.