該雜志國(guó)際簡(jiǎn)稱:X-RAY SPECTROM,是由出版商John Wiley and Sons Ltd出版的一本致力于發(fā)布物理與天體物理研究新成果的的專業(yè)學(xué)術(shù)期刊。該雜志以SPECTROSCOPY研究為重點(diǎn),主要發(fā)表刊登有創(chuàng)見(jiàn)的學(xué)術(shù)論文文章、行業(yè)最新科研成果,扼要報(bào)道階段性研究成果和重要研究工作的最新進(jìn)展,選載對(duì)學(xué)科發(fā)展起指導(dǎo)作用的綜述與專論,促進(jìn)學(xué)術(shù)發(fā)展,為廣大讀者服務(wù)。該刊是一本國(guó)際優(yōu)秀雜志,在國(guó)際上有很高的學(xué)術(shù)影響力。
Enamels analysis of Doucai porcelain with Chenghua mark by non-destructive micro-EDXRF
Author: Gong, Yuwu; Xiong, Yingfei; Wang, Enyuan; Chen, Jie
英文介紹
X-ray Spectrometry雜志英文介紹
X-Ray Spectrometry is devoted to the rapid publication of papers dealing with the theory and application of x-ray spectrometry using electron, x-ray photon, proton, γ and γ-x sources.
Covering advances in techniques, methods and equipment, this established journal provides the ideal platform for the discussion of more sophisticated X-ray analytical methods.
Both wavelength and energy dispersion systems are covered together with a range of data handling methods, from the most simple to very sophisticated software programs. Papers dealing with the application of x-ray spectrometric methods for structural analysis are also featured as well as applications papers covering a wide range of areas such as environmental analysis and monitoring, art and archaelogical studies, mineralogy, forensics, geology, surface science and materials analysis, biomedical and pharmaceutical applications.